00762nam0-22002891i-450-990001085640403321000108564FED01000108564(Aleph)000108564FED0100010856420000920d1963----km-y0itay50------baengX-Ray Studies of MaterialsA. Guinier, D.L. DexterNew York [etc.]Interscience1963CristallografiaRaggi x548Guinier,A.20010Dexter,D.l.ITUNINARICAUNIMARCBK99000108564040332137-021.00115700FI1FI1X-ray studies of materials125087UNINAING01