00928nam0-22003251i-450-9900010214904033213-540-10518-2000102149FED01000102149(Aleph)000102149FED0100010214920000920d1981----km-y0itay50------baengPoint Defects in Semiconductors ITheoretical AspectsMichel Lannoo, Jacques Bourgoinwith a foreword by J. FriedelBerlin [etc.]Springer-Verlag1981Springer seriesSuperficiDifetti530.4Lannoo,Michel48491Bourgin,JacquesFriedel,J.ITUNINARICAUNIMARCBK99000102149040332132B-02813727FI1FI1Point Defects in Semiconductors I339785UNINAING01