00766nam0-22002651i-450-990001011270403321000101127FED01000101127(Aleph)000101127FED0100010112720000920d1968----km-y0itay50------baeng1968 Intermag ConferenceScanning Electron Micrograph of Plated Cross SectionNew YorkIEEE1968IEEE Transactions on Magnetics Vol. Mag-4 N. 3 September 1968.Proprietà magnetiche538.3ITUNINARICAUNIMARCBK99000101127040332129A-03014740FI1FI11968 Intermag Conference354964UNINAING01