00936nam1-22003011i-450-99000088986040332120001010000088986FED01000088986(Aleph)000088986FED0100008898620001010d--------km-y0itay50------baitay-------001yyProceedings of the Regional Conference on the Planning and Design of Tall Buildings Vol.IWarsawASCE-IABS1972.0019900009005204033212001 Vol.I0019900009005304033212001 Vol. IIVolte sottiliProceedings492455ITUNINARICAUNIMARCBK99000088986040332103 VS.0,892842IINTCIINTCProceedings of the Regional Conference on the Planning and Design of Tall Buildings Vol.I356553UNINAING0101538aam 2200421I 450 991071120790332120151113033705.0GOVPUB-C13-4646cdf83eb3d85078c192b8fbc3fba9(CKB)5470000002481947(OCoLC)929067526(EXLCZ)99547000000248194720151113d1996 ua 0engrdacontentrdamediardacarrierDielectric measurements using a reentrant cavity mode-Matching analysis James Baker-Jarvis, Bill F. Riddle /James Baker-Jarvis, Bill RiddleGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1996.1 online resourceNIST technical note ;13841996.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Dielectric measurements using a reentrant cavity Dielectric measurementsDielectric measurements.Baker-Jarvis James1393083Baker-Jarvis James1393083Riddle Bill1401500United States.National Bureau of Standards.NBSNBSGPOBOOK9910711207903321Dielectric measurements using a reentrant cavity3494460UNINA