00842nam0-22002891i-450 99000069513040332120221208164249.020001010d1933----km-y0itay50------baitaITy-------001yyDisciplina dell' attivita' ediliziaVirgilio Testa.TivoliMantero Ed.193332 p.26 cmEs. privo di front. - Pubblicato nel n.3 della Rivista "Concessioni e Costruzioni"71123itaTesta,Virgilio1994ITUNINARICAUNIMARCBK99000069513040332101 LEG 57donoDINSTBusta 12 (34) 1734398FGBCDINSTFGBCDisciplina dell' attivita' edilizia324927UNINAING0101474nam 2200385Ia 450 991070081010332120110824100537.0(CKB)5470000002412920(OCoLC)747709181(EXLCZ)99547000000241292020110824d1996 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierGeothermal opportunities in Eastern Europe[electronic resource] a survey /prepared by L.R. Lawrence, Jr., Bojan StoyanovAlexandria, VA :Bob Lawrence & Associates, Inc. ;[Washington, D.C.]:[U.S. Dept. of Energy, Office of Energy Efficiency and Renewable Energy, Geothermal Technologies Program],[1996]1 online resource (54 pages) maps (chiefly color)Title from title screen (viewed on Aug. 24, 2011)."January 1996."Includes bibliographical references.Geothermal opportunities in Eastern Europe Geothermal resourcesEurope, EasternGeothermal resourcesLawrence L. R1409281Stoyanov Bojan1409237Geothermal Technologies Program (U.S.)Bob Lawrence & Associates.GPOGPOBOOK9910700810103321Geothermal opportunities in Eastern Europe3495254UNINA01563oam 2200433Ia 450 991069933930332120230902162202.0(CKB)5470000002402524(OCoLC)227908497(EXLCZ)99547000000240252420080513d2006 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierPulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor[electronic resource] /by Timothy E. GriffinAdelphi, MD :Army Research Laboratory,[2006]1 online resource (vi, 22 pages) illustrationsARL-TR ;3993Title from PDF title screen (ARL, viewed Mar. 23, 2010)."November 2006."ARL-TR (Aberdeen Proving Ground, Md.) ;3993.Pulsed capacitance measurement of silicon carbide Pulsed power systemsDiodes, Schottky-barrierMetal oxide semiconductorsPulsed power systems.Diodes, Schottky-barrier.Metal oxide semiconductors.Griffin Timothy E1391748U.S. Army Research Laboratory.DTICEDTICEGPOBOOK9910699339303321Pulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor3471624UNINA