00908nam0-22003131i-450-99000052743040332120091021104843.00-7803-1062-4000052743FED01000052743(Aleph)000052743FED0100005274320020821d1990----km-y0itay50------baenga-------001yyDigital systems testing and testable designMiron Abramovici, Melvin A. Breuer, Arthur D. FriedmanPiscatawayIEEE Press©1990.XVIII,652 p.ill.27 cmCircuiti integrati digitali621.381.'5Abramovici,MironBreuer,Melvin A.Friedman,Arthur D.ITUNINARICAUNIMARCBK99000052743040332110 E I 388DIET 1892DINELDINELUNINA