00985nam0-22003251i-450-99000051833040332120071116133705.00-8155-1200-7000051833FED01000051833(Aleph)000051833FED0100005183320020821d1989----km-y0itay50------baenga-------001yyCharacterization of semiconductor materialsprinciples and methodsedited by Gary E. McGuirePaek Bridge, New JerseyNoyes Publicationsc1989v.ill.24 cmMaterials science and process technology series1. v.Semiconduttori621.3815'2McGuire,Gary E.27694ITUNINARICAUNIMARCBK99000051833040332110 E I 377DIE 900DINELDINELCharacterization of semiconductor materials330925UNINA