01022nam0-22003371i-450-99000051251040332120080806122639.00-07-100208-1000051251FED01000051251(Aleph)000051251FED0100005125120020821d1987----km-y0itay50------baenga-------001yySoftware reliabilitymeasurement, prediction, applicationJohn D. Musa, Anthony Iannino, Kazuhira OkumotoNew YorkMcGraw-Hill©1987621 p.ill.22 cmMcGraw-Hill series in software engineering and technologySoftware005.1'4Musa,John D.492102Iannino,Anthony492103Okumoto,Kazuhira492104ITUNINARICAUNIMARCBK99000051251040332110 P.T. 5711898 DISDINELDINELSoftware reliability330509UNINA