00876nam0-22003131i-450-99000050308040332120071008170000.00-486-62215-0000050308FED01000050308(Aleph)000050308FED0100005030820020821d1970----km-y0itay50------baenga-------001yyMultiple-beam Interferometry of surfaces and filmsS. TolanskyNew YorkDoverc1970186 p.ill.21 cmInterferometriaMetallografia535.4Tolansky,Samuel2010ITUNINARICAUNIMARCBK99000050308040332110 B III 216L/218DINELDINELMultiple-beam Interferometry of surfaces and films329991UNINA