00846nam0-22003011i-450-99000048968040332120071114164814.0000048968FED01000048968(Aleph)000048968FED0100004896820020821d1965----km-y0itay50------baenga-------001yySilicon semiconductor technologyW. R. RunyanNew YorkMcGraw-Hillc1965277 p.ill.25 cmTexas instruments electronics seriesSemiconduttoriSilicio004.53Rynyan,W. R.491748ITUNINARICAUNIMARCBK99000048968040332110 E I 30711310DINELDINELSilicon semiconductor technology332695UNINA01557nam0 2200325 i 450 VAN012587120220311094047.994N978365824531320191212d2018 |0itac50 baengDE|||| |||||Fatigue of Materials at Very High Numbers of Loading CyclesExperimental Techniques, Mechanisms, Modeling and Fatigue Life AssessmentHans-Jürgen Christ editorWiesbadenSpringer2018IX, 628 p.ill.24 cmDEWiesbadenVANL000457620.1Scienze dei materiali22669Metallurgia - Chimica dei metalli - Materiali metallici22537.622Semiconduttività22621.48332Materiali strutturali22ChristHans-JürgenVANV097277Springer <editore>VANV108073650ITSOL20240614RICAhttps://link.springer.com/book/10.1007/978-3-658-24531-3E-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHEIT-CE0101VAN17NVAN0125871BIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE17CONS e-book 2112 17BIB2112/327 327 20191212 Fatigue of Materials at Very High Numbers of Loading Cycles1568379UNICAMPANIA