01134nam0-22003971i-450-99000034940040332120110615165808.0000034940FED01000034940(Aleph)000034940FED0100003494020110615d1960----km-y0itay50------baengNLy-------001yyX-ray microscopy and x-ray microanalysisproceedings of the second international symposium, Stockholm, 1960edited by A. Engstrom, V. Cosslett, H. PatteeAmsterdamElsevier1960X, 542 p.ill.28 cmCristallografiaRaggi X540548Engström,ArneCosslett,V.Pattee,H.ITUNINARICAUNIMARCBK990000349400403321IIIg C 163595DMVSF04 128-23CA/CNR 44/LDINCH37-0122042FI1DINCHFI1DMVSFX-ray microscopy and x-ray microanalysis125091UNINA