01010nam0-22003251i-450-99000029035040332120001010000029035FED01000029035(Aleph)000029035FED0100002903520001010d--------km-y0itay50------baitay-------001yyPARTICLE characterization in technologyEditor John Keith Beddow.Boca RantonCrc presscopyr. 19842 voll., ill., 26 cmCRC series on fine Particle science and technologyv. 1: Applications and Microanalysis. v. 2: Morphological Analysis.620Beddow,John KeithITUNINARICAUNIMARCBK99000029035040332104 162-78/2OPV IRC 1534/L-IDINCH04 162-78/1OPV IRC 1534/LDINCHDINCHPARTICLE characterization in technology127821UNINAING01