00910nam0-22003131i-450-990000253660403321200010100-7216-9180-3000025366FED01000025366(Aleph)000025366FED0100002536620001010d--------km-y0itay50------baitay-------001yyFundamentals of the tracer methodTeresa J. C. Welch , E. James Potchen , Michael J. Welch.PhiladelphiaW. B. Saunders company1972X, 187 p. ill. 24 cmProbabilità e statisticaWelch,Teresa Jean ConocchialiPotchen,E. James<1932- >Welch,Michael JohnITUNINARICAUNIMARCBK99000025366040332109 042-0733456DINAEDINAEUNINAING0101281nam 2200373Ka 450 991069517520332120060620094202.0(CKB)5470000002366976(OCoLC)70141007(EXLCZ)99547000000236697620060620d2004 ua 0engtxtrdacontentcrdamediacrrdacarrierGain characterization of the RF measurement path[electronic resource] /J. Wayde Allen[Washington, D.C.] :[National Telecommunications and Information Administration],[2004]iii, 16 pages digital, PDF fileNTIA report ;TR-04-410Title from title screen (viewed on June 20, 2006)."February 2004."Includes bibliographical references.Radio measurementsSignal processingRadio measurements.Signal processing.Allen J. Wayde1382011United States.National Telecommunications and Information Administration.GPOGPOBOOK9910695175203321Gain characterization of the RF measurement path3424965UNINA