01430nam0 22003373i 450 UBO026402620231121125852.0082478248820141209d1997 ||||0itac50 baengusz01i xxxe z01nLinear and nonlinear models for the analysis of repeated measurementsEdward F. Vonesh, Vernon M. ChinchilliNew York \etc.!Marcel Dekkerc1997XII, 560 p.24 cm.1 dischetto.Statistics: textbooks and monographs154001MIL00351652001 Statistics: textbooks and monographs154Analisi multivariataFIRRMLC226161IProgettazione sperimentaleFIRRMLC383170I519.535Analisi multivariata. Analisi di struttura latente21Vonesh, Edward F.UBOV105515070460692Chinchilli, Vernon M.UBOV1055160701447799ITIT-0120141209IT-FR0099 Biblioteca Area IngegneristicaFR0099 UBO0264026Biblioteca Area Ingegneristica 54DMS 519.5 VON 54VM 0000508115 VM barcode:BAIN005152. - Inventario:1603MVMA 2004113020121204 54Linear and nonlinear models for the analysis of repeated measurements3639729UNICAS