01367nam0 22003253i 450 TO0142681320231121125845.0019510751920110922d1993 ||||0itac50 baenggbz01i xxxe z01nScanning and transmission electron microscopyan introductionStanley L. Flegler, John W. Heckman, Karen L. KlomparensNew YorkOxfordOxford University Press©1993VIII, 225 p.26 cm.Microscopio elettronicoFIRRMLC380675I502.82521Flegler, Stanley L.TO0V5497100701447597Heckman, John W.TO0V5497110701447598Klomparens, Karen L.UANV0011390701447599ITIT-0120110922IT-RM1163 IT-FR0099 Istituto Centrale Restauro Conservazione Patrimonio Archivistico LibrarioRM1163 SBiblioteca Area IngegneristicaFR0099 TO01426813Biblioteca Area Ingegneristica 54DMS 502.8 FLE 54VM 0000338985 VM barcode:BAIN001244. - Inventario:879MVMA 2003062020121204 36 54Scanning and transmission electron microscopy3638777UNICAS