01065nam0 22003011i 450 RML028602620231121125732.0038794541520121121d1995 ||||0itac50 baengusz01i xxxe z01nQuantitative x-ray diffractometryLev S. Zevin, Giora Kimmeledited by Inez MureinikNew York Springer 1995xviii, 372 p.23 cm.545.8121Zevin, Lev S.RMLV184677754961Kimmel, GioraRMLV1846761445067Mureinik, InezRMLV184675340ITIT-0120121121IT-FR0099 Biblioteca Area IngegneristicaFR0099 RML0286026Biblioteca Area Ingegneristica 54DII 545 ZEV 54VM 0000558065 VM barcode:BAIN001711. - Inventario:4551DVMA 2005050620121204 54Quantitative x-ray diffractometry3627223UNICAS