01276nam0 22003371i 450 RML026647720231121125722.0019850189720121121d1999 ||||0itac50 baenggbz01i xxxe z01nDefect and microstructure analysis by diffractionRobert L. Snyder, Jaroslav Fiala, Hans J. BungeOxford Oxford University Press 1999xxii, 785 p.24 cmCristallografiaFIRRMLC016679IDiffrazione di polveriFIRRMLC380567IMicrostrutturaFIRRMLC381155I548.8321Snyder, Robert L.RMLV171444100291Bunge, Hans J.RMLV1714421444528Fiala, JaroslavRMLV1714431444529ITIT-0120121121IT-FR0099 Biblioteca Area IngegneristicaFR0099 RML0266477Biblioteca Area Ingegneristica 54DMS 548 SNY 54VM 0000369135 VM barcode:BAIN004197. - Inventario:1073MVMA 2003120320121204 54Defect and microstructure analysis by diffraction3624783UNICAS