02109nam0 22004573i 450 VAN021276120230612110842.949N978981130454520210916d2018 |0itac50 baengSG|||| |||||Progress in Nanoscale Characterization and ManipulationRongming Wang …et al.] editorsSingaporeSpringer ; BeijingPeking University Press2018vii, 508 p.ill.24 cm001VAN01327952001 Springer Tracts in Modern Physics210 Berlin [etc.]Springer272VAN0212762Progress in Nanoscale Characterization and Manipulation186832400BxxConference proceedings and collections of articles [MSC 2020]VANC021742MF00A79 (77-XX)Physics [MSC 2020]VANC023182MF81V35Nuclear physics [MSC 2020]VANC023270MFAberration Corrected Transmission Electron MicroscopyKW:KCharged-particle microscopyKW:KElectron MicroanalysisKW:KElectron/Ion OpticsKW:KHelium Ion MicroscopyKW:KIn situ TEMKW:KScanning Electron MicroscopyKW:KTransmission Electron MicroscopyKW:KSGSingaporeVANL000061BeijingVANL001586WangRongmingVANV182899Peking UniversityVANV182900650Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-981-13-0454-5E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0212761BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 3800 08eMF3800 20210916 Progress in Nanoscale Characterization and Manipulation1868324UNICAMPANIA