01923nam0 22004213i 450 VAN021152120230609123504.440N978331975325620210907d2018 |0itac50 baengCH|||| |||||Optical Characterization of Thin Solid FilmsOlaf Stenzel, Miloslav Ohlídal editorsChamSpringer2018xxiv, 462 p.ill.24 cm001VAN01328742001 Springer Series in Surface Sciences210 Berlin [etc.]Springer64VAN0211522Optical Characterization of Thin Solid Films252711074-XXMechanics of deformable solids [MSC 2020]VANC022466MF74K35Thin films [MSC 2020]VANC033952MF74A50Structured surfaces and interfaces, coexistent phases [MSC 2020]VANC036162MFInterface SpectroscopyKW:KOptical Coating CharacterizationKW:KOptical ConstantsKW:KOptical Properties of Thin Solid FilmsKW:KSolid State SpectroscopyKW:KSpectroscopic Imaging SpectrophotometryKW:KCHChamVANL001889OhlídalMiloslavVANV182131StenzelOlafVANV106998Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-319-75325-6E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0211521BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 3624 08eMF3624 20210907 Optical Characterization of Thin Solid Films2527110UNICAMPANIA