01956nam0 22004213i 450 VAN017879320230616092533.473N978981100578720210709d2016 |0itac50 baengSG|||| |||||New Technologies in Electromagnetic Non-destructive TestingSongling Huang, Shen WangSingaporeSpringerTsinghua University Press2016x, 222 p.ill.24 cm001VAN01248482001 Springer Series in Measurement Science and Technology210 Berlin [etc.]SpringerVAN0178794New Technologies in Electromagnetic Non-destructive Testing182145678-XXOptics, electromagnetic theory [MSC 2020]VANC022356MF00A79 (77-XX)Physics [MSC 2020]VANC023182MFElectromagnetic nondestructive testingKW:KElectromagnetic ultrasonic guided waveKW:KMagnetic flux leakageKW:KMetal magnetic memoryKW:KPulsed eddy currentKW:KRemote field eddy currentKW:KSGSingaporeVANL000061HuangSonglingVANV160794816195WangShenVANV160801816196Springer <editore>VANV108073650Tsinghua universityVANV114356650ITSOL20240614RICAhttp://doi.org/10.1007/978-981-10-0578-7E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0178793BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 2985 08eMF2985 20210709 New Technologies in Electromagnetic Non-destructive Testing1821456UNICAMPANIA