01929nam0 22004333i 450 VAN016442820230614030718.471N978331939531920210623d2016 |0itac50 baengCH|||| |||||Metrology and Physical Mechanisms in New Generation Ionic DevicesDoctoral Thesis accepted by the KU Leuven and IMEC, BelgiumUmberto CelanoChamSpringer2016xxiv, 175 p.ill.24 cm001VAN01041932001 Springer thesesrecognizing outstanding Ph.D. research210 BerlinSpringer2010-VAN0164429Metrology and Physical Mechanisms in New Generation Ionic Devices180813278-XXOptics, electromagnetic theory [MSC 2020]VANC022356MF00A79 (77-XX)Physics [MSC 2020]VANC023182MF3D MetrologyKW:KAFM TomographyKW:KC-AFMKW:KConductive Bridging Memory CBRAMKW:KConductive FilamentsKW:KIonic DevicesKW:KRRAMKW:KResistive SwitchingKW:KScalpel SPMKW:KCHChamVANL001889CelanoUmbertoVANV097926805582Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-319-39531-9E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0164428BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 2778 08eMF2778 20210623 Metrology and Physical Mechanisms in New Generation Ionic Devices1808132UNICAMPANIA