02108nam0 2200469 i 450 VAN013339120230619085941.23N978366243634920210412d2015 |0itac50 baengDE|||| |||||Laser Measurement TechnologyFundamentals and ApplicationsAxel Donges, Reinhard NollBerlinHeidelbergSpringer2015xiv, 422 p.ill.24 cm001VAN00210152001 Springer series in optical sciences210 Berlin [etc.]Springer188VAN0134211Laser Measurement Technology177141078-XXOptics, electromagnetic theory [MSC 2020]VANC022356MF00A79 (77-XX)Physics [MSC 2020]VANC023182MF78A40Waves and radiation in optics and electromagnetic theory [MSC 2020]VANC027741MFHolografic InterferometryInline Process ControlKW:KLaser Beam Shaping and GuidingKW:KLaser Doppler MethodsKW:KLaser InterferometryKW:KLaser Measurement TechnologyKW:KLaser SpectroscopyKW:KLaser-Matter InteractionKW:KProperties of Laser RadiationKW:KSpeckle Measurements MethodsKW:KBerlinVANL000066DEHeidelbergVANL000282DongesAxelVANV107125792194NollReinhardVANV107126792195Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-662-43634-9E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0133391BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 2240 08eMF2240 20210412 Laser Measurement Technology1771410UNICAMPANIA