01908nam0 2200409 i 450 VAN013326020230623110855.792N978443154448720210408d2014 |0itac50 baengJP|||| |||||Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron MicroscopesNagamitsu YoshimuraTokyoSpringer2014xi, 125 p.ill.24 cm001VAN01034342001 SpringerBriefs in applied sciences and technology210 Berlin [etc.]SpringerVAN0157058Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscope180047501-XXHistory and biography [MSC 2020]VANC021469MF00A79 (77-XX)Physics [MSC 2020]VANC023182MF78A15Electron optics [MSC 2020]VANC036196MFContamination Build UpKW:KElectron microscopeKW:KField Emission Electron GunKW:KJapan Electron Optics LaboratoryKW:KSputter Ion PumpKW:KVibration FreeKW:KTokyoVANL000048YoshimuraNagamitsuVANV107010792018Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-4-431-54448-7E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0133260BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 2171 08eMF2171 20210408 Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscope1800475UNICAMPANIA