01008nam0 22002651i 450 VAN004574920240314114138.90605-214-6196-020060529d1996 |0itac50 baengUS|||| |||||Photoinduced defects in semiconductorsDavid Redfield, Richard H. BubeCambridgeCambridge university1996X, 217 p.ill.23 cmCambridgeVANL000024RedfieldDavidVANV036662726820BubeRichard H.VANV036663602644Cambridge university <editore>VANV107986650ITSOL20240315RICABIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIAIT-CE0100VAN05VAN0045749BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05PREST J III 111 05 3213 20060529 Photoinduced defects in semiconductors1422444UNICAMPANIA