01218nam0 22002891i 450 VAN004175420220727123316.43104-7118-172-220060308d1999 |0itac50 baengUS|||| |||||Spectroscopic ellipsometry and reflectometrya user's guideHarland G. Tompkins, William A. McGahanNew YorkJ. Wileyc1999XIV, 228 p.ill.24 cm001VAN00253402001 ˆA ‰Wiley Interscience publication210 New YorkWileyVAN0248687Spectroscopic ellipsometry and reflectometry1421801USNew YorkVANL000011TompkinsHarland G.VANV034516727342McGahanWilliam A.VANV034517727341Wiley <editore>VANV108092650ITSOL20230915RICABIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIAIT-CE0100VAN05VAN0041754BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05PREST M I 056 05 2996 20060308 BuonoSpectroscopic ellipsometry and reflectometry1421801UNICAMPANIA