01362nam0 22002891i 450 VAN003647120221107021305.5008-7891-513-320050523d1996 |0itac50 baengUS|||| |||||ˆThe ‰differential equations problem solvera complete solution guide to any textbookResearch and Education Association, M. Fogiel, directorNew YorkREA1996XIX, 1390 p.26 cm001VAN00363132001 REA's problem solvers210 PischatawayResearch and education association.VAN0239972ˆThe ‰differential equations problem solver : a complete solution guide to any textbook2961691USNew YorkVANL000011FogielMaxVANV033251Research and education associationNew YorkVANV030465Research and education associationVANV111750650ITSOL20230616RICABIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIAIT-CE0100VAN05VAN0036471BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05PREST D 222 05 1202 20050523 Differential equations problem solver : a complete solution guide to any textbook2961691UNICAMPANIA01303nam 2200385 450 991029645760332120230814230356.01-5386-9466-2(CKB)4100000007213033(WaSeSS)IndRDA00121940(EXLCZ)99410000000721303320200416d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE 27th Asian Test Symposium 15-18 October 2018, Hefei, China /IEEE Computer SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (79 pages)1-5386-9467-0 Electronic digital computersTestingCircuitsCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectronic digital computersTestingCircuitsElectronic circuitsTestingFault-tolerant computing621.3815IEEE Computer Society,WaSeSSWaSeSSPROCEEDING99102964576033212018 IEEE 27th Asian Test Symposium2528000UNINA