03794nam0 22005533i 450 VAN0031004420260903031958.942N978303144233920260903d2024 |0itac50 baengCH|||| |||||i e bcrActive probe atomic force microscopya practical guide on precision instrumentationFangzhou Xia, Ivo W. Rangelow, Kamal Youcef-ToumiChamSpringer20241 testo elettronico (XXIV, 366 p.ill. )From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. (Dal sito dell'editore)74M05Control, switches and devices ("smart materials'') in solid mechanics [MSC 2020]VANC038407MF81V45Atomic physics [MSC 2020]VANC023266MF93-XXSystems theory; control [MSC 2020]VANC027040MF93B30System identification [MSC 2020]VANC023144MF93C85Automated systems (robots, etc.) in control theory [MSC 2020]VANC037119MF93C95Application models in control theory [MSC 2020]VANC034073MFActive probeKW:KAtomic force microscopeKW:KInstrumentationKW:KMechatronicsKW:KMetrologyKW:KNano-fabricationKW:KCHChamVANL001889XiaFangzhouVANV2753851631646RangelowIvo W.VANV2753871631647Youcef-ToumiKamalVANV08412125116Springer <editore>VANV108073650Xia, F.Xia, FangzhouVANV275386Rangelow, I. W.Rangelow, Ivo W.VANV275388Rangelow, I.W.Rangelow, Ivo W.VANV275389Rangelow, Ivo WrightRangelow, Ivo W.VANV275390Youcef-Toumi, K.Youcef-Toumi, KamalVANV275391ITSOL20261002RICAhttps://doi.org/10.1007/978-3-031-44233-9E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00310044BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 13374 08eMF13374 20260925 Active Probe Atomic Force Microscopy3970445UNICAMPANIA