02089nam0 22005173i 450 VAN0029967620251216120149.666N978146121578320251020d1999 |0itac50 baengUS|||| |||||i e bcrScan Statistics and ApplicationsJoseph Glaz, N. Balakrishnan editorsNew YorkSpringer ; BostonBirkhäuser1999xxi, 324 p.ill.24 cm001VAN001025002001 Statistics for industry and technology210 Boston [etc]Birkhäuser62NxxSurvival analysis and censored data [MSC 2020]VANC027776MF62PxxApplications of statistics [MSC 2020]VANC027777MFApproximationsKW:KCalculusKW:KContinuous scan statisticsKW:KDNA sequence approachKW:KDiscrete scan statisticsKW:KFinite Markov chain imbeddingKW:KModelsKW:KMonte-Carlo SimulationKW:KObserved cluster of eventsKW:KOrder StatisticsKW:KProbability modelsKW:KUSNew YorkVANL000011BostonVANL000051BalakrishnanNarayanaswamyVANV080051340GlazJosephVANV099003340Birkhäuser <editore>VANV108193650Springer <editore>VANV108073650ITSOL20251219RICAhttps://doi.org/10.1007/978-1-4612-1578-3E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00299676BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 12952 08eMF12952 20251104 Scan Statistics and Applications4447790UNICAMPANIA