05576nam 2200637 450 991082418910332120230801225940.03-03813-699-9(CKB)2670000000314549(EBL)1872826(SSID)ssj0000849573(PQKBManifestationID)11443868(PQKBTitleCode)TC0000849573(PQKBWorkID)10812683(PQKB)11627154(Au-PeEL)EBL1872826(CaPaEBR)ebr10828215(OCoLC)872671166(MiAaPQ)EBC1872826(EXLCZ)99267000000031454920130219h20122012 uy| 0engur|n|---|||||txtccrElectron microscopy XIV selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /edited by Danuta Stróż and Krystian PrusikDurnten-Zurich, Switzerland ;Enfield, NH, USA :TTP,[2012]©20121 online resource (352 p.)Solid state phenomena,1012-0394 ;volumes 186Description based upon print version of record.3-03785-381-6 Includes bibliographical references and indexes.Electron Microscopy XIV; Preface and Conference Photo; Table of Contents; Methods of Electron Crystallography as Tools for Materials Analysis; Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films; Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science; The Art and Application of Large Angle Convergent Beam Electron Diffraction; Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM; Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEMA Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food SupplementsPhysical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy; 3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography; 3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography; Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron TomographyMartensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSDInvestigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope; Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM; High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks; Study of Silicon Nanoparticles Formation in Silicon Nitride; Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam EpitaxyWurtzite-to Amorphous-to Cubic Phase Transition of GaN1-XAsx Alloys with Increasing as ContentStudy of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications; Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy; Crystallization and Microstructure of Co0.75Ni0.25Si2 Solid Solution; Nanotexture Studies of NiTi Shape Memory Alloy after Severe Plastic Deformation with the Use of TEM; SEM EBSD and TEM Structure Studies of α-Brass after Severe Plastic Deformation Using Equal Channel Rolling Followed by Groove PressingCrystallographic Aspects of Deformation and Recrystallization in ECAP-Processed AA3104 Aluminium AlloyMicrostructure of the Ni-W Solid Solution Prepared by Levitation and after High Pressure Torsion Severe Plastic Deformation; Near Grain Boundary Behavior of Aluminum Bicrystals Deformed in Plane Strain Conditions; Microstructure and Texture Evolutions in AA1200 Aluminum Alloy Deformed by Accumulative Roll Bonding Method; Gradient Microstructure of FeCr30Co8 Hard Magnetic Alloy Subjected to Plastic Deformation by Tension Combined with Torsion at 700 and 720°CEffect of Rapid Solidification on the Structure and Mechanical Properties of AZ91 Magnesium AlloyThese are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisla, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and iDiffusion and defect data.Pt. B,Solid state phenomena ;volumes 186.Electron microscopyCongressesElectron microscopyElectron microscopy502.825Stróż Danuta1650612Prusik Krystian1650613International Conference on Electron MicroscopyMiAaPQMiAaPQMiAaPQBOOK9910824189103321Electron microscopy XIV4000063UNINA01851nam0 22004573i 450 VAN0028486420250327094747.357N978303129493820250117d2023 |0itac50 baengCH|||| |||||i e bcrEssays on Astronomical History and HeritageA Tribute to Wayne Orchiston on his 80th BirthdaySteven Gullberg, Peter Robertson editorsChamSpringer2023xli, 700 p.ill.24 cm001VAN001618252001 Historical & Cultural Astronomy210 Cham [etc.]Springer2016-00A79 (77-XX)Physics [MSC 2020]VANC023182MF85-XXAstronomy and Astrophysics [MSC 2020]VANC023246MFAncient AstronomyKW:KArchaeoastronomyKW:KAstronomyKW:KAstrophysicsKW:KEthnoastronomyKW:KRadio AstronomyKW:KSolar eclipsesKW:KTransits of VenusKW:KCHChamVANL001889GullbergSteven R.VANV189751RobertsonPeterfisicoVANV238757Springer <editore>VANV108073650ITSOL20250613RICAhttps://doi.org/10.1007/978-3-031-29493-8E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00284864BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 10287 08eMF10287 20250124 Essays on astronomical history and heritage3555513UNICAMPANIA