02131nam0 22005053i 450 VAN0028416820251031100757.204N978981169569820241216d2022 |0itac50 baengSG|||| |||||i e bcrMaterial Characterization Techniques and ApplicationsEuth Ortiz Ortega ... [et al.]SingaporeSpringer2022xv, 305 p.ill.24 cm001VAN001081292001 Progress in Optical Science and Photonics210 ChamSpringer2013-1900A79 (77-XX)Physics [MSC 2020]VANC023182MF78-XXOptics, electromagnetic theory [MSC 2020]VANC022356MFAtomic Force MicroscopyKW:KDRIFT SpectroscopyKW:KElectrochemical Impedance SpectroscopyKW:KFourier-transform Infrared spectroscopyKW:KHigh-Performance Liquid ChromatographyKW:KMALDI-TOF SpectrometryKW:KOptical MicroscopyKW:KRaman spectroscopyKW:KScanning Electron MicroscopyKW:KThermal gravimetric analysisKW:KTransmission Electron MicroscopyKW:KWettability AnalysisKW:KX-Ray Photoelectron SpectroscopyKW:KSGSingaporeVANL000061Ortiz OrtegaEuthVANV237923Springer <editore>VANV108073650ITSOL20251107RICAhttps://doi.org/10.1007/978-981-16-9569-8E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00284168BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 10172 08eMF10172 20241220 Material Characterization Techniques and Applications4300587UNICAMPANIA