02052nam0 22005053i 450 VAN0028389820250218035930.185N978303086174220241210d2022 |0itac50 baengCH|||| |||||i e bTheory and Practice of Thermal Transient Testing of Electronic ComponentsMarta Rencz, Gábor Farkas, András Poppe editorsChamSpringer2022ix, 385 p.ill.24 cm00A79 (77-XX)Physics [MSC 2020]VANC023182MF78-XXOptics, electromagnetic theory [MSC 2020]VANC022356MF94-XXInformation and communication theory, circuits [MSC 2020]VANC019701MFBipolar transistorsKW:KCapacitorsKW:KIGBT devicesKW:KMOS transistorsKW:KReliability TestingKW:KResistorsKW:KSi diodesKW:KStructure integrity testingKW:KThermal characterizationKW:KThermal testingKW:KThermal transient testingKW:KWide bandgap materialsKW:KCHChamVANL001889FarkasGáborVANV237578PoppeAndrásVANV237579RenczMartaVANV237577Springer <editore>VANV108073650ITSOL20250221RICAhttps://doi.org/10.1007/978-3-030-86174-2E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00283898BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 10105 08eMF10105 20241219 Theory and Practice of Thermal Transient Testing of Electronic Components3091260UNICAMPANIA