01244nam0 22003013i 450 VAN0027743020240806101548.210978303122021020240607d2023 |0itac50 baengCH|||| |||||Optimal Inspection Models with Their ApplicationsKodo Ito, Toshio NakagawaChamSpringer2023X, 261 p.24 cm001VAN000710022001 Springer series in reliability engineering210 LondonSpringer2005-CHChamVANL001889ItoKodoVANV2298861345841NakagawaToshioVANV055914724944Springer <editore>VANV108073650ITSOL20240906RICAhttps://doi.org/10.1007/978-3-031-22021-0E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA CENTRO DI SERVIZIO SBAVAN15NVAN00277430BIBLIOTECA CENTRO DI SERVIZIO SBA15CONS SBA EBOOK 13845 15EB 13845 20240607 Optimal Inspection Models with Their Applications4164559UNICAMPANIA