04618nam 2200697 a 450 991087763200332120200520144314.01-280-65470-897866106547030-470-36250-20-471-74909-50-471-74908-710.1002/0471749095(CKB)1000000000355036(EBL)275904(SSID)ssj0000244006(PQKBManifestationID)11188932(PQKBTitleCode)TC0000244006(PQKBWorkID)10164982(PQKB)11507748(MiAaPQ)EBC275904(CaBNVSL)mat05237928(IDAMS)0b00006481095e09(IEEE)5237928(OCoLC)163140623(JP-MeL)3000111653(Au-PeEL)EBL275904(CaPaEBR)ebr10305091(CaONFJC)MIL65470(PPN)19037747X(EXLCZ)99100000000035503620050420d2006 uy 0engur|n|---|||||txtccrSemiconductor material and device characterization /Dieter K. Schroder3rd ed.[Piscataway, NJ] IEEE Press ;Hoboken, N.J. Wileyc20061 online resource (799 p.)"Wiley-Interscience."0-471-73906-5 Includes bibliographical references and index.Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: . Updated and revised figures and examples reflecting the most current data and information. 260 new references offering access to the latest research and discussions in specialized topics. New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: . Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.SemiconductorsSemiconductorsTestingSemiconductors.SemiconductorsTesting.621.3815/2549.8njb/09621.3815/2njb/09Schroder Dieter K324644MiAaPQMiAaPQMiAaPQBOOK9910877632003321Semiconductor material and device characterization767613UNINA02887nim0 22002893i 450 VAN0024678620240806101407.139978-12-503-0494-020220608d2018 |0itac50 baengUS||||1 |||||Fair shotrethinking nequality and how we earnChris HughesNew YorkMacmillan Audio20181 audiolibro (04:57 min.)In this fascinating audiobook, Facebook co-founder Chris Hughes argues that the best way to fight income inequality is with a radically simple idea: a guaranteed income for working people, paid for by the one percent.The first half of Chris Hughes's life played like a movie reel right out of the'American Dream.'He grew up in a small town in North Carolina. 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This audiobook, grounded in Hughes's personal experience, will start a frank conversation about how we earn in modern America, how we can combat income inequality, and ultimately, how we can give everyone a Fair Shot.USNew YorkVANL000011HughesChrisVANV201881550111153MacMillan <editore>VANV111155650ITSOL20250321RICAhttps://search.ebscohost.com/login.aspx?custid=s7606536&authtype=ip,sso&direct=true&site=ehost-live&scope=site&db=nlabk&db=nlebk&AN=1717117Audiobook-Accesso attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI ECONOMIAIT-CE0106VAN03NVAN00246786BIBLIOTECA DEL DIPARTIMENTO DI ECONOMIA03CONS AUDIOBOOK Eco 03 33564 20220608 Fair shot2856326UNICAMPANIA02231oas 2200721 a 450 991089128590332120251105213014.01885-8104(DE-599)ZDB2263061-2(OCoLC)240897311(CONSER) 2010267120(CKB)1000000000238488(EXLCZ)99100000000023848820080807a20049999 uy spaur|||||||||||txtrdacontentcrdamediacrrdacarrierCuadernos internacionales de tecnología para el desarrollo humanoMadrid Federación Española de Ingeniería Sin Fronteras1697-820X Quaderns internacionals de tecnologia per al desenvolupamment humàCuadernos internacionales de TDHCuadernos TpDHSustainable developmentDeveloping countriesPeriodicalsTechnologyDeveloping countriesPeriodicalsEngineeringDeveloping countriesPeriodicalsEconomic historyfast(OCoLC)fst00901974Engineeringfast(OCoLC)fst00910312Sustainable developmentfast(OCoLC)fst01139731Technologyfast(OCoLC)fst01145078Developing countriesEconomic conditionsPeriodicalsDeveloping countriesfastPeriodicals.fastSustainable developmentTechnologyEngineeringEconomic history.Engineering.Sustainable development.Technology.Ingeniería Sin FronterasUniversitat Politècnica de CatalunyaSFBSFBOCLCSOCLCQDOSOCLCQCUSOCLCQOCLCFOCLCOOCLCQOCLCAOCLCQOCLCLOCLCQJOURNAL9910891285903321Cuadernos internacionales de tecnología para el desarrollo humano2141582UNINA