01646nam0 22003613i 450 VAN0024334920240806101358.858N978331943220520220321d2016 |0itac50 baengCH|||| |||||Dielectric Breakdown in Gigascale ElectronicsTime Dependent Failure MechanismsJuan Pablo Borja, Toh-Ming Lu, Joel PlawskyChamSpringer2016VIII, 105 p.ill.24 cm001VAN001232452001 SpringerBriefs in Materials210 Cham [etc.]SpringerCHChamVANL001889620.5Nanotecnologia22621.39Microingegneria22620.1Scienze dei materiali22621.319Circuiti22BorjaJuan PabloVANV1988571059898LuToh-MinVANV1988581213859PlawskyJoelVANV1988591213860Springer <editore>VANV108073650ITSOL20240906RICAhttps://link.springer.com/book/10.1007/978-3-319-43220-5E-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHEIT-CE0101VAN17NVAN00243349BIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE17CONS e-book 2220 17BIB2220/301 301 20220321 Dielectric Breakdown in Gigascale Electronics2803372UNICAMPANIA