02120nam0 22004693i 450 VAN0021139520240806101230.481N978331999825120210906d2018 |0itac50 baengCH|||| |||||Lock-in ThermographyBasics and Use for Evaluating Electronic Devices and MaterialsOtwin Breitenstein, Wilhelm Warta, Martin C. Schubert3. edChamSpringer2018xxi, 321 p.ill.24 cm001VAN000631312001 Springer series in advanced microelectronics210 Berlin [etc.]Springer10VAN00211396Lock-in Thermography277972100A79 (77-XX)Physics [MSC 2020]VANC023182MF78A60Lasers, masers, optical bistability, nonlinear optics [MSC 2020]VANC029030MFElectronic Device Failure AnalysisKW:KIC Failure AnalysisKW:KIlluminated LIT applied to solar cellsKW:KLIT application to spin caloritronics problemsKW:KNon-thermal LIT lifetime mappingKW:KPower devices for electric carsKW:KShunt ImagingKW:KSolar Cell CharacterizationKW:KTrap Density MappingKW:KCHChamVANL001889BreitensteinOtwinVANV1820511063465SchubertMartin C.VANV1820531076487WartaWilhelmVANV182052324087Springer <editore>VANV108073650ITSOL20241115RICAhttp://doi.org/10.1007/978-3-319-99825-1E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00211395BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-book 3581 08eMF3581 20210906 Lock-in Thermography2779721UNICAMPANIA