01918nam0 2200409 i 450 VAN0013326020240806100839.48N978443154448720210408d2014 |0itac50 baengJP|||| |||||Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron MicroscopesNagamitsu YoshimuraTokyoSpringer2014xi, 125 p.ill.24 cm001VAN001034342001 SpringerBriefs in applied sciences and technology210 Berlin [etc.]Springer2011-VAN00157058Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscope180047500A79 (77-XX)Physics [MSC 2020]VANC023182MF01-XXHistory and biography [MSC 2020]VANC021469MF78A15Electron optics [MSC 2020]VANC036196MFContamination Build UpKW:KElectron microscopeKW:KField Emission Electron GunKW:KJapan Electron Optics LaboratoryKW:KSputter Ion PumpKW:KVibration FreeKW:KTokyoVANL000048YoshimuraNagamitsuVANV107010792018Springer <editore>VANV108073650ITSOL20240906RICAhttp://doi.org/10.1007/978-4-431-54448-7E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00133260BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 2171 08eMF2171 20210408 Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscope1800475UNICAMPANIA