02932nam 2200589 a 450 991046270200332120200520144314.03-527-67503-5(CKB)2670000000342930(EBL)1161984(OCoLC)836403150(SSID)ssj0001192835(PQKBManifestationID)11684653(PQKBTitleCode)TC0001192835(PQKBWorkID)11227475(PQKB)10371421(MiAaPQ)EBC481344(Au-PeEL)EBL481344(CaPaEBR)ebr10682369(CaONFJC)MIL194693(OCoLC)264717029(EXLCZ)99267000000034293020130410d2013 uy 0engur|n|---|||||txtccrReliability of MEMS[electronic resource] testing of materials and devices /edited by Osamu Tabata, Toshiyuki Tsuchiya2nd ed.Weinheim Wiley-VCH20131 online resource (325 p.)Advanced micro & nanosystemsFirst edition 2007.3-527-33501-3 Includes bibliographical references and index.Title Page; Preface; Foreword; Contents; List of Contributors; Overview; 1 Evaluation of Mechanical Properties of MEMS Materials and Their Standardization; 2 Elastoplastic Indentation Contact Mechanics of Homogeneous Materials and Coating - Substrate Systems; 3 Thin film Characterization Using the Bulge Test; 4 Uniaxial Tensile Test for MEMS Materials; 5 On chip Testing of MEMS; 6 Reliability of a Capacitive Pressure Sensor; 7 Inertial Sensors; 8 High accuracy, High reliability MEMS Accelerometer; 9 Reliability of MEMS Variable Optical Attenuator; 10 Eco Scan MEMS Resonant Mirror; IndexNow available in softcover, this book closely examines the enabling technologies for the fabrication of micro- and nanodevices. Divided into two clearly structured sections, the first begins with an insider's view of industrial MEMS commercialization, followed by chapters on capacitive interfaces for MEMS, packaging issues of micro- and nanosystems, MEMS contributions to high frequency integrated resonators and filters, as well as the uses of MEMS in mass data storage and electrochemical imaging by means of scanning micro- and nanoprobes. The second section on nanodevices first tackles theAdvanced micro & nanosystems.Microelectromechanical systemsReliabilityElectronic books.Microelectromechanical systemsReliability.539.60113Tabata Osamu892953Tsuchiya Toshiyuki917771MiAaPQMiAaPQMiAaPQBOOK9910462702003321Reliability of MEMS2057813UNINA02224nam0 2200445 i 450 VAN0010433120240806100725.789N978-81-322-1886-920151221d2014 |0itac50 baengIN|||| |||||Sequence spaces and measures of noncompactness with applications to differential and integral equationsJózef Banaś, Mohammad MursaleenNew DelhiSpringer2014XII, 315 p.24 cmVAN00241441Sequence spaces and measures of noncompactness with applications to differential and integral equations140999634G20Nonlinear differential equations in abstract spaces [MSC 2020]VANC024637MF45-XXIntegral equations [MSC 2020]VANC020265MF46-XXFunctional analysis [MSC 2020]VANC019764MF46A45Sequence spaces (including Köthe sequence spaces) [MSC 2020]VANC031510MF47H08Measures of noncompactness and condensing mappings, $K$-set contractions, etc. [MSC 2020]VANC031511MFCompact OperatorsKW:KDifferential and integral equationsKW:KMatrix transformationsKW:KMeasures of noncompactnessKW:KOrdinary Differential EquationsKW:KPartial Differential EquationsKW:KSequence spacesKW:KINNew DelhiVANL001098BanaśJózefVANV07924854270Mursaleen‎MohammadVANV080639721633Springer <editore>VANV108073650ITSOL20250627RICAhttp://dx.doi.org/10.1007/978-81-322-1886-9E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA CENTRO DI SERVIZIO SBAVAN15NVAN00104331BIBLIOTECA CENTRO DI SERVIZIO SBA15CONS SBA EBOOK 4359 15EB 4359 20191106 Sequence spaces and measures of noncompactness with applications to differential and integral equations1409996UNICAMPANIA