01010nam0 22002651i 450 VAN0004574920240806100436.67805-214-6196-020060529d1996 |0itac50 baengUS|||| |||||Photoinduced defects in semiconductorsDavid Redfield, Richard H. BubeCambridgeCambridge university1996X, 217 p.ill.23 cmCambridgeVANL000024RedfieldDavidVANV036662726820BubeRichard H.VANV036663602644Cambridge University <editore>VANV107986650ITSOL20250124RICABIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIAIT-CE0100VAN05VAN00045749BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05PREST K 825 05 3213 20060529 Photoinduced defects in semiconductors1422444UNICAMPANIA