01425nam0 22002891i 450 VAN0002995920240806100342.60235-405-8479-X20041209d1995 |0itac50 baengUS|||| |||||Energy-filtering transmission electron microscopyLudwig Reimer (ed.)with contributions by C. Deininger ... [et al.]BerlinHeidelbergSpringer1995XIII, 424 p.ill.25 cm001VAN000210152001 Springer series in optical sciences210 Berlin [etc.]Springer71BerlinVANL000066ReimerLudwigVANV02479914910Springer <editore>VANV108073650ITSOL20240906RICAhttps://link.springer.com/content/pdf/bfm:978-3-540-48995-5/1?pdf=chapter%20tochttps://link.springer.com/content/pdf/bfm:978-3-540-48995-5/1?pdf=chapter%20tochttps://link.springer.com/book/10.1007/978-3-540-48995-5https://link.springer.com/book/10.1007/978-3-540-48995-5BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIAIT-CE0100VAN05VAN00029959BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA05PREST K 169 05 1426 20041209 BuonoEnergy-filtering transmission electron microscopy1431593UNICAMPANIA