01052nam0 2200277 i 450 SUN000156920111013112319.84788-14-05086-4IT95 1014220020701d1995 |0itac50 baitaIT|||| |||||ˆI ‰rapporti internazionali in materia penaleestradizione, rogatorie, effetti delle sentenze penali straniereGiulio CatelaniMilanoGiuffrè[1995]VIII, 349 p.24 cm.Giustizia penaleCooperazione internazionaleFISUNC001032MilanoSUNL000284341.7821Catelani, GiulioSUNV001580147024GiuffrèSUNV001757650ITSOL20181231RICASUN0001569UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI GIURISPRUDENZA00CONS XIV.Ec.2 00 5541 20020709 Rapporti internazionali in materia penale648128UNICAMPANIA03349 am 22008053u 450 991013714700332120230621141109.0(CKB)3710000000752784(oapen)https://directory.doabooks.org/handle/20.500.12854/29376(EXLCZ)99371000000075278420160725h20162016 uy 0gerurmn#nnn|||||txtrdacontentcrdamediacrrdacarrierDas materielle Computerstrafrecht /Christian BergauerJan Sramek Verlag2016Wien :Jan Sramek Verlag,[2016]©20161 online resource (xxviii, 669 pages) digital, PDF file(s)Open Access e-BooksKnowledge UnlatchedIT und StrafrechtPrint version: 3709700434 Includes bibliographical references (pages 631-669)The aims of the present study are to describe the modern forms of cybercrime and analyze the substantive computer-specific offenses of the Austrian Penal Code by the means of specialist literature and - as available - relevant judgments. Based on the debate about the terms “cybercrime” or “computer criminal law” and the term of data in the Austrian Penal Code, the specific substantive computer-specific offenses, including the penal provision of the Data Protection Code concerning the criminal protection of personal data, are presented and discussed systematically.IT und Strafrecht.Computer crimesLaw and legislationAustriaDenial of service attacksLaw and legislationAustriaPhishingLaw and legislationAustriaCyberstalkingLaw and legislationAustriaHackingLaw and legislationAustriaCyberterrorismLaw and legislationAustriaMalware (Computer software)Law and legislationAustriaInternet pornographyLaw and legislationAustriaInternet fraudLaw and legislationAustriaCybercrimesubstantive criminal lawmalicious softwaredenial of service-attackshackingCyber-bullyingComputerkriminalitätComputerstrafrechtMalwareDatenbeschädigungSystemschädigungenHackingCyber-MobbingInternetTatbestandComputer crimesLaw and legislationDenial of service attacksLaw and legislationPhishingLaw and legislationCyberstalkingLaw and legislationHackingLaw and legislationCyberterrorismLaw and legislationMalware (Computer software)Law and legislationInternet pornographyLaw and legislationInternet fraudLaw and legislation345.0268Bergauer Christian930051AuAdUSAAuAdUSAUkMaJRUBOOK9910137147003321Das materielle Computerstrafrecht2091668UNINA04492nam 2200589Ia 450 991043805520332120200520144314.03-642-33956-510.1007/978-3-642-33956-1(CKB)2670000000360432(EBL)1082754(OCoLC)832643287(SSID)ssj0000878814(PQKBManifestationID)11543423(PQKBTitleCode)TC0000878814(PQKBWorkID)10837330(PQKB)11088973(DE-He213)978-3-642-33956-1(MiAaPQ)EBC1082754(PPN)169138240(EXLCZ)99267000000036043220130327d2013 uy 0engur|n|---|||||txtccrEllipsometry at the nanoscale /Maria Losurdo, Kurt Hingerl, editors1st ed. 2013.Berlin ;New York Springerc20131 online resource (740 p.)Description based upon print version of record.3-642-33955-7 Includes bibliographical references.Preamble -- Preface -- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis -- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations -- Relationship between Surface Morphology and Effective Medium Roughness -- Plasmonics and Effective-Medium Theory -- Thin films of Nanostructured Plasmonic Noble Metals.-  Spectroscopic Ellipsometry on Metallic Gratings -- Mueller matrix applied to nanostructures -- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles -- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition -- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures -- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates -- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale -- Polarimetric and other Optical Probes for the Solid - Liquid Interface -- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices -- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications -- Ellipsometry of semiconductor nanocrystals -- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry -- Thin film applications in research and industry characterized by spectroscopic ellipsometry -- Ellipsometry and Correlation Measurements -- Nanotechnology: Applications and markets, present and future.This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.EllipsometryPolarimetryNanotechnologyEllipsometry.Polarimetry.Nanotechnology.620.1/1295Losurdo Maria1761683Hingerl Kurt1761684MiAaPQMiAaPQMiAaPQBOOK9910438055203321Ellipsometry at the nanoscale4201281UNINA