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1. |
Record Nr. |
UNISALENTO991001264899707536 |
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Titolo |
Analyzing multiscale phenomena using singular perturbation methods : American Mathematical Society short course, January 5-6, 1998, Baltimore, Maryland / Jane Cronin, Robert E. O'Malley, Jr., editors |
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Pubbl/distr/stampa |
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Providence, RI : American Mathematical Society, 1999 |
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ISBN |
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Descrizione fisica |
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Collana |
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Proceedings of symposia in applied mathematics, 0160-7634 ; 56. AMS short course lecture notes |
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Classificazione |
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AMS 34D15 |
AMS 34E15 |
LC QA372.A54 |
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Altri autori (Persone) |
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Cronin, Janeauthor |
O'Malley, Robert E. |
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Altri autori (Enti) |
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American Mathematical Society : Short course <1998 : Baltimore, Maryland> |
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Disciplina |
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Soggetti |
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Singular perturbations (Mathematics) - Congresses |
Differentiable dynamical systems - Congresses |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di bibliografia |
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Includes bibliographical references and index |
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2. |
Record Nr. |
UNISALENTO991003242779707536 |
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Autore |
Whitehouse, David J. |
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Titolo |
Surfaces and their measurement [e-book] / David Whitehouse |
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Pubbl/distr/stampa |
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ISBN |
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Descrizione fisica |
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xi, 395 p. : ill. ; 25 cm |
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Disciplina |
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Soggetti |
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Surfaces (Technology) - Measurement |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Risorsa elettronica |
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Livello bibliografico |
Monografia |
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Nota di bibliografia |
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Includes bibliographical references and index |
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Nota di contenuto |
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1. What is surface metrology? 2. Measurement of surfaces. 3. Profile parameter characterisation. 4. Surfaces in manufacture. 5. Function and surface texture. 6. Surface finish instrumentation. 7. Stylus instruments. 8. Optical methods. 9. Scanning microscopes. 10. Errors of form. 11. Roundness and related subjects. 12. Cylindricity, sphericity etc. 13. Instrument design for minimum error. 14. Calibration of instruments. 15. Sampling, numerical analysis, display. Glossary. |
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Sommario/riassunto |
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The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. Written by one of the world's leading metrologists Covers electronics and optics applications as well as mechanical Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia |
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