Record Nr.

UNISA996564470003316

Titolo

Proceedings : ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Pubbl/distr/stampa


Los Alamitos, California : , : CPS, Conference Publishing Services, IEEE Computer Society, , [2011]-

Disciplina

621

Soggetti

Integrated circuits - Very large scale integration - Design and construction

Integrated circuits - Fault tolerance

Nanotechnology

Circuits intégrés - Tolérance aux fautes

Nanotechnologie

Conference papers and proceedings.

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Periodico