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1. |
Record Nr. |
UNINA9910436657403321 |
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Titolo |
Latins and Greeks in the Eastern Mediterranean after 1204 / edited by Benjamin Arbel, Bernard Hamilton, David Jacoby |
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Pubbl/distr/stampa |
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London, : Frank Cass, 1989 |
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ISBN |
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Descrizione fisica |
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Disciplina |
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Locazione |
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Collocazione |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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2. |
Record Nr. |
UNISALENTO991000078549707536 |
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Autore |
Scovenna, Marina |
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Titolo |
Geometria analitica / M. Scovenna |
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Pubbl/distr/stampa |
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ISBN |
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Descrizione fisica |
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viii, 471 p. : ill. ; 27 cm |
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Collana |
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Disciplina |
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Soggetti |
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Geometria analitica - Testi scolastici |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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3. |
Record Nr. |
UNISA996483071403316 |
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Autore |
Ružbarský Juraj |
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Titolo |
Contactless system for measurement and evaluation of machined surfaces / / Juraj Ružbarský |
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Pubbl/distr/stampa |
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Cham, Switzerland : , : Springer, , [2022] |
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©2022 |
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ISBN |
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9783031089817 |
9783031089800 |
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Descrizione fisica |
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1 online resource (105 pages) |
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Collana |
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SpringerBriefs in Applied Sciences and Technology |
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Disciplina |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Intro -- Preface -- Introduction -- Contents -- Symbols and Abbreviations -- 1 Current State of the Art -- 1.1 Surface Roughness -- 1.2 Machined Surface Characteristics -- 1.2.1 Quality of Machined Surface Area -- 1.2.2 Theoretical and Actual Surface Roughness -- 1.2.3 Geometric Surface Waviness -- 1.3 Quality Parameters -- 1.3.1 Evaluation of Surface Character -- 1.4 Measurement of Machined Surface Roughness -- 1.4.1 Roughness Measurement Methods -- 1.4.2 Roughness Measurement Devices and Methods -- 1.5 Contact Methods of Roughness Measurement -- 1.5.1 Measruement System MAHR MarSurf PS1 -- 1.5.2 Measuring Instrument CarlZeiss Handysurf E-35A -- 1.6 Contactless Methods of Roughness Measurement -- 1.6.1 Measurement by Laser Sensor -- 1.6.2 Measurement System MAHR MarSurf WS 1 -- 1.6.3 Measuring Instrument Taylor Hobson CCI HD -- 1.7 Laser Profilometry LPM -- 1.7.1 Laser -- 1.7.2 Laser Light Color and Performance -- 1.8 Basic Components of Experimental Set-Ups of Optical 3D Methods -- 1.8.1 Point and Linear Optical Structures -- 1.8.2 Planar Optical Structures -- 1.8.3 Intensity Optical Structures -- 1.8.4 Applied Optical Detectors -- 1.8.5 CCD Detectors -- 1.8.6 CMOS Detectors -- 1.9 Overview of Applied 3D Methods -- 1.9.1 Laser Triangulation -- 1.9.2 Fourier Profilometry -- 1.9.3 Phase Shifting Profilometry -- 1.9.4 Phase Measuring Deflectometry -- 1.9.5 Moiré Topography -- 1.9.6 White |
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Light Interferometry -- 1.9.7 Fizeau Interferometry -- 1.10 Comparison of Parameters of Equipment Applied in Surface Roughness Measurement -- References -- 2 Laser Profilometer Design -- 2.1 Frame Structure -- 2.2 Micrometric Slide -- 2.3 Objective -- 2.4 CMOS Camera -- 2.5 Applied Laser -- 2.6 Lighting -- 2.7 LPM View Software -- 2.8 General Characteristics of the LPM System -- References -- 3 Production of Experimental Samples. |
3.1 Material Characteristics of Proposed Samples -- 3.2 Production of Samples by AWJ Technology -- References -- 4 Description of Measuring Experiment -- 4.1 Measurement of Selected Roughness Parameters by Contact Method -- 4.2 Measurement of Selected Roughness Parameters by Contactless Method -- 5 Measurement of Roughness Parameters by Contact Surface Roughness Tester -- 5.1 Samples with Declared Roughness of Ra = 6.3 μm (AL120, SS050, FS050) -- 5.2 Samples with Declared Roughness of Ra = 12.5 μm (AL220, SS120, FS100) -- 5.3 Samples with Declared Roughness of Ra = 25 μm (AL370, SS150, FS150) -- 6 Measurement of Roughness Parameters by Contactless Laser Profilometer LPM -- 6.1 Samples with Declared Roughness of Ra = 6.3 μm (AL120, SS050, FS050) -- 6.2 Samples with Declared Roughness of Ra = 12.5 μm (AL220, SS120, FS100) -- 6.3 Samples with Declared Roughness of Ra = 25 μm (AL370, SS150, FS150) -- 7 Glossy Surface Measurement -- 7.1 Comparison of Achieved Results by Contact and Contactless Roughness Surface Testers -- Reference -- 8 Conclusion -- Uncited References. |
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