Advances in Knowledge Discovery and Data Mining [[electronic resource] ] : 23rd Pacific-Asia Conference, PAKDD 2019, Macau, China, April 14-17, 2019, Proceedings, Part I / / edited by Qiang Yang, Zhi-Hua Zhou, Zhiguo Gong, Min-Ling Zhang, Sheng-Jun Huang

• Record Nr.: UNISA996466316203316
• Pubbl/distr/stampa: Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019
• ISBN: 3-030-16148-X
• Edizione: [1st ed. 2019.]
• Descrizione fisica: 1 online resource (XL, 627 p. 310 illus., 146 illus. in color.)
• Collana: Lecture Notes in Artificial Intelligence ; ; 11439
• Disciplina: 006.3
• Soggetti: Artificial intelligence; Data mining; Application software; Optical data processing; Computer security; Artificial Intelligence; Data Mining and Knowledge Discovery; Information Systems Applications (incl. Internet); Image Processing and Computer Vision; Computer Appl. in Social and Behavioral Sciences; Systems and Data Security
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Includes index.
• Sommario/riassunto: The three-volume set LNAI 11439, 11440, and 11441 constitutes the thoroughly refereed proceedings of the 23rd Pacific-Asia Conference on Knowledge Discovery and Data Mining, PAKDD 2019, held in Macau, China, in April 2019. The 137 full papers presented were carefully reviewed and selected from 542 submissions. The papers present new ideas, original research results, and practical development experiences from all KDD related areas, including data mining, data warehousing, machine learning, artificial intelligence, databases, statistics, ; knowledge engineering, visualization, decision-making systems, and the emerging applications. They are organized in the following topical sections: classification and supervised learning; text and opinion mining; spatio-temporal and stream data mining; factor and tensor analysis; healthcare, bioinformatics and related topics; clustering and anomaly detection; deep learning models and applications; sequential pattern mining; weakly supervised learning; recommender system; social network and graph mining; data pre-processing and feature selection; representation learning and embedding; mining unstructured and semi-structured data; behavioral data mining; visual data mining; and knowledge graph and interpretable data mining.

Nanoscale characterization of surfaces and interfaces / / N. John DiNardo

• Record Nr.: UNINA9910144717503321
• Autore: DiNardo N. John
• Pubbl/distr/stampa: Weinheim, [Germany] : , : VCH, , 1994; ©1994
• ISBN: 1-281-84293-1; 9786611842932; 3-527-61595-4; 3-527-61594-6
• Descrizione fisica: 1 online resource (176 p.)
• Disciplina: 530.427; 620.44
• Soggetti: Surfaces (Physics); Scanning tunneling microscopy; Nanotechnology
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references.
• Nota di contenuto: Nanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); ; 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control; 2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy; 3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; 3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces; 4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References
• Sommario/riassunto: Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.Topics include:Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charg