1.

Record Nr.

UNISA996396506203316

Autore

Salmon Thomas <1648-1706.>

Titolo

An essay to the advancement of musick [[electronic resource] ] : by casting away the perplexity of different cliffs, and uniting all sorts of musick, lute, viol, violin, organ, harpsechord, voice, &c. in one universal character / / by Thomas Salmon .

Pubbl/distr/stampa

London, : Printed by J. Macock and to be sold by John Car ..., 1672

Descrizione fisica

[18], 92, [1] p., [5] leaves of plates : music

Altri autori (Persone)

BirchenshaJohn <fl. 1664-1672.>

Soggetti

Musical notation

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Added t.p., engraved.

Preface signed: John Birchensha.

Music on double plates.

Errata: p. [18].

Advertisement: p. [1] at end.

Reproduction of original in Library of Congress.

Sommario/riassunto

eebo-0078



2.

Record Nr.

UNINA9910695757703321

Autore

Verrill S. P

Titolo

JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data [[electronic resource] /] / Steve P. Verrill, David E. Kretschmann, Victoria L. Herian

Pubbl/distr/stampa

Madison, WI : , : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, , [2006]

Descrizione fisica

70 pages : digital, PDF file

Collana

Research paper FPL-RP ; ; 635

Altri autori (Persone)

KretschmannDavid E

HerianVictoria L

Soggetti

Wood - Quality - Computer simulation

Wood - Mechanical properties

Microfibrils

X-rays - Diffraction

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Title from title screen (viewed on Mar. 29, 2007).

"July 2006."

Nota di bibliografia

Includes bibliographical references (pages 10-11).

Sommario/riassunto

X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing tools, we expect it to yield more accurate estimates of MFA.