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1. |
Record Nr. |
UNISA996396506203316 |
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Autore |
Salmon Thomas <1648-1706.> |
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Titolo |
An essay to the advancement of musick [[electronic resource] ] : by casting away the perplexity of different cliffs, and uniting all sorts of musick, lute, viol, violin, organ, harpsechord, voice, &c. in one universal character / / by Thomas Salmon . |
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Pubbl/distr/stampa |
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London, : Printed by J. Macock and to be sold by John Car ..., 1672 |
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Descrizione fisica |
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[18], 92, [1] p., [5] leaves of plates : music |
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Altri autori (Persone) |
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BirchenshaJohn <fl. 1664-1672.> |
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Soggetti |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Added t.p., engraved. |
Preface signed: John Birchensha. |
Music on double plates. |
Errata: p. [18]. |
Advertisement: p. [1] at end. |
Reproduction of original in Library of Congress. |
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Sommario/riassunto |
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2. |
Record Nr. |
UNINA9910695757703321 |
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Autore |
Verrill S. P |
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Titolo |
JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data [[electronic resource] /] / Steve P. Verrill, David E. Kretschmann, Victoria L. Herian |
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Pubbl/distr/stampa |
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Madison, WI : , : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, , [2006] |
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Descrizione fisica |
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70 pages : digital, PDF file |
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Collana |
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Research paper FPL-RP ; ; 635 |
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Altri autori (Persone) |
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KretschmannDavid E |
HerianVictoria L |
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Soggetti |
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Wood - Quality - Computer simulation |
Wood - Mechanical properties |
Microfibrils |
X-rays - Diffraction |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed on Mar. 29, 2007). |
"July 2006." |
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Nota di bibliografia |
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Includes bibliographical references (pages 10-11). |
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Sommario/riassunto |
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X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing tools, we expect it to yield more accurate estimates of MFA. |
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