1.

Record Nr.

UNISA996280731803316

Titolo

IEEE Std 1500-2005 : IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / Institute of Electrical and Electronics Engineers

Pubbl/distr/stampa

New York, NY : , : IEEE, , 2005

ISBN

0-7381-4694-3

Descrizione fisica

1 online resource (viii, 117 pages) : illustrations (some color)

Disciplina

004.16

Soggetti

Embedded computer systems

Integrated circuits - Testing

Systems on a chip

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.