IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) : IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa
Piscataway, NJ, USA : , : IEEE, , 2016
ISBN
1-5044-0596-X
Descrizione fisica
1 online resource (230 pages)
Disciplina
621.3815
Soggetti
Boundary scan testing
Microelectronics
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Sommario/riassunto
IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.