The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing

• Record Nr.: UNISA996216505403316
• Pubbl/distr/stampa: New York : , : IEEE, , 2008
• ISBN: 1-5090-8441-X
• Descrizione fisica: 1 online resource (xxxi, 545 pages)
• Soggetti: Integrated circuits - Very large scale integration - Design and construction; Fault-tolerant computing
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Includes index.