1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

• Record Nr.: UNISA996212474703316
• Pubbl/distr/stampa: [Place of publication not identified], : IEEE Electron Devices Society, 1997
• Disciplina: 621.3815
• Soggetti: Integrated circuits - Reliability - Congresses; Integrated circuits - Congresses - Reliability - Wafer-scale integration; Electrical & Computer Engineering; Electrical Engineering; Engineering & Applied Sciences
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Bibliographic Level Mode of Issuance: Monograph