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1. |
Record Nr. |
UNISA996212464703316 |
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Titolo |
IWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 1998 |
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Disciplina |
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Soggetti |
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Semiconductors - Statistical methods - Characterization |
Semiconductors - Measurement |
Electrical Engineering |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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